Malvern PANalytical Empyrean (3rd Generation) X-ray Diffractometer with high temperature Anton Paar chamber
A state-of-the-art multi-purpose X-ray diffractometer capable of phase identification, quantification, structural analysis, thin film characterization, and non-ambient diffraction studies.
Application / Use
- Phase identification and quantification of crystalline materials
- Crystallography and structural refinement
- Thin film analysis (stress, texture, epitaxy)
- In situ non-ambient studies (temperature, atmosphere, pressure)
- Cement, ceramics, catalysts, semiconductors, and advanced materials research
Key Features / Specs
- Equipped with three interchangeable stages:
- Standard sample disc holder
- Spinner stage for zero-background holders
- Anton Paar non-ambient chamber (up to 1600 °C, controlled atmosphere, inert/low pressure)
- High-resolution goniometer with multi-mode optics
- Wide range of detectors (PIXcel or equivalent)
- Capable of grazing incidence, residual stress, and texture measurements
Material / Sample Type
Powders, thin films, nanomaterials, ceramics, catalysts, metals, cementitious materials, semiconductors.