Phenom ProX Desktop SEM
A compact scanning electron microscope designed for fast, high-resolution imaging of surfaces, with fully integrated energy-dispersive X-ray spectroscopy (EDS) for elemental analysis.
Application / Use
Provides morphological and compositional analysis of metals, polymers, ceramics, minerals, coatings, and biological samples. Widely used in materials science, quality control, and failure analysis.
Key Features / Specs
- Magnification range up to ~130,000×
- Resolution down to 10–15 nm
- Integrated EDS detector for elemental analysis
- Fast sample loading with motorized stage options
- User-friendly software with automated reporting
Material / Sample Type
Metals, alloys, powders, polymers, composites, minerals, coatings, biological tissues (non-living, conductive).